nanoDAC
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Deformation measurement from load state micro/nanographs
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In the tour the crack opening of a thermoset polymer
Compact Tension (CT) specimen is choosen as an
example for the capability of the nanoDAC approach.
The first topographic AFM scan (left) is carried
out in unloaded state. Then the CT-specimen is
subjected to a defined mode I loading and the
second scan (right) is carried out at this load
state.
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load state 1
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load state 2
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